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3042−Q |
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Gate Charge Tester |
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Thel Gate Charge Tester 3042-Q measures the gate charge of MOSFET.
This tester is equipped with CONTACT CHECK and OPEN / SHORT test functions, and performs high volume production testing.
■Features
・Single or dual die MOSFET device test
・Standard Tester / Handler interface
・Kelvin test with 20mA constant current
・Device Functional pre-test [Open/short]
・Auto or Manual test operation
・User-friendly interface, dataloging, program editor,
and test summary
・Networking capability (option)
・Simple calibration procedure.
・Fully programmable Forcing conditions and Parameters
・High Drain current capability up to 50 A
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3042-Q

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| Parameter |
Range |
Resolution |
Unit |
| QGS1 |
0.5 to 499.9 |
0.1 |
nC |
| QGS2 |
0.5 to 499.9 |
0.1 |
nC |
| QG-SWITCH |
0.5 to 499.9 |
0.1 |
nC |
| QG-CONTROL |
0.5 to 499.9 |
0.1 |
nC |
| QG-SYNC |
0.5 to 499.9 |
0.1 |
nC |
| QOSS |
0.5 to 499.9 |
0.1 |
nC |
| CDV/DT |
0.1 to 999.9 |
0.1 |
μs |
| RDSON |
0.001 to 1.999 |
0.001 |
Ω |
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| Conditions |
Range |
Resolution |
Unit |
| Drain voltage (Vds) |
5.0 to 60.0 |
0.25 |
V |
| Drain current (Id max) |
2.0 to 50.0 |
0.2 |
A |
| Vg max |
2.0 to 15.0 |
0.1 |
V |
| Id@Vth |
200.0 to 999.9 |
50 |
μA |
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