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Discrete Device Test System 【881-TT/A 381-TT/P】

Discrete Device Test System

881−TT/A  381−TT/P Test Systems for Discrete Devices

The 881-TT/A is a high performance test system which covers wide range of discrete semiconductor devices from small signal devices to power devices. As the most popular tester in the world corresponding to the steady progress of semiconductor devices in specifications and performance, 881-TT/A has received high estimation in its reliability.

■Feature
・1kV/20A Capability in Main Frame
・Parallel Test Capability (381-TT/P)

■Test Method

・TBB : Test By Branch
・TBS : Test By Sort

■Optional Software
・Host Link
・Data Analysis
・Wafer Mapping


881-TT/A


  ■Specifications
 Model  881-TT/A 381-TT/P
 Host CPU Personal Computer
 Operating System Microsoft(R) Windows XP/Vista
 Test Mode Single Parallel
 Data Display 4-digit high speed A/D conversion
 Test Stations 1x 5 2x 2
 Max Voltage 999V(*3,000V Option)
 Max Current 20A(*100A/200A/300A/600A/1,200A Option)
 Test Plan 250
 Sort Plan 250
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*For details, please refer to the standard specification sheets of each product.

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