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These test systems are designed for fast and reliable measurement of the
electrical characteristics of various discrete devices. Each test system
incorporates a personal computer, enabling interactivity through a Windows
interface for easy creation of test programs and network connectivity.
Especially for high current and higher voltage, these test systems boast unmatched performance, based on advanced measurement technology. They have retained leading market shares for many years. On top of DC measurement, time measurement and function test are also available for logic chips by IC test system.
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 Discrete Device Test System |
@Diode, Transistor, FET, Dual Gate FET, MOSFET, Thyrister, Voltage Regulator,
IGBT,
@SCR/Triac, Opto-coupler, Array |
| Thermal Resistance Tester |
@TransistorADarlingtonAMOSFETAIGBTADiode |
| Inductive Load Tester |
@TransistorADarlingtonAMOSFET |
| Dynamic Test System |
@IGBTAMOSFET |
| IPD/IPMTest System |
@IPD/IPM, Diode, Transistor, FET, Dual Gate FET, IGBT, Voltage Regulator,
Opto-coupler, Triac |
| Internal Gate Resistance Tester |
@MOSFET |
| Gate Charge Tester |
@MOSFET |
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A handler automatically sorts semiconductor devices according to the measurement
data from linked testers. The handlers can be easily retrofitted - using
a conversion kit - to accommodate a variety of device shapes, sizes, and
weights. These handlers realize reasonable price, small footprint, simple
mechanism and easy operation.
Depending on the semiconductor type and application, additional functions such as temperature tests, lead-cutting and marking are available.
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