5880-IH

The 5880-IH is a high-performance strip frame test handler. It enables the inspection of semiconductor devices on strip frames without singulation. By combining a high-load, high-precision stage with advanced position correction technology, it achieves high-throughput testing through high-parallel measurement. This contributes to increased production capacity and reduced inspection costs in mass production processes, leading to improved overall efficiency at semiconductor manufacturing sites.
Furthermore, it supports high and low temperature testing from -55°C to +170°C, delivering highly reliable mass production inspection. As an optimal solution for strip inspection of SO packages and QFN devices, it supports the stable supply of high-quality semiconductor products.

Features

・High Throughput via High-Parallel Measurement
Enhances productivity on mass production lines through multi-site measurement.

・High-Precision Alignment Function
Maintains stable contact quality using position and height correction technologies.

・Support for High and Low Temperature Reliability Testing
Supports temperature environment testing from -55°C to +170°C, contributing to improved reliability in mass production inspection.

・Jam-Free Transfer
Maintains high utilization rates even during long-term operation through stable device transfer.

・Smart Factory Compatibility
Seamlessly integrates into automated lines thanks to support for SECS/GEM, barcode/2D code management, and AGVs.