1969

TES Corporation established in Higashiyamato, Tokyo with a paid-up-capital of JPY 1 million.

Wire Bonder, Discrete Device Tester, and Discrete Device Handler developed.

1972

Corporate Headquarters moved to Kamikitadai, Higashiyamato, Tokyo.

1973

Hot Handler for discrete device developed.

1974

IC Handler developed.

1975

Thermal Resistance Tester developed.

1978

Marking Machine developed.

1980

TES Corporation changed its name to TESEC Corporation.

Ina Factory opened in Minowamachi, Kami-ina, Nagano.

1981

TESEC EUROPE Office opened in Cergy, France.

Thermal Resistance Tester for GaAsFET developed.

1982

TESEC USA Office opened in Connecticut, USA.

1983

TESEC (M) SDN.BHD. opened in Kuala Lumpur Malaysia.

SO/DIP Handler and Laser Marking Machine developed.

1984

TESEC USA Office changed its name to TESEC, INC.

TESEC SEMICONDUCTOR EQUIPMENT (SINGAPORE) PTE.LTD. opened in Kallang Bahru, Singapore (closed in 2003).

1985

TESEC EUROPE Office changed its name to TESEC EUROPE S.A.

1988

Discrete Device Tester controlled with MS-Windows developed.

1989

SOT23 Integrated System developed.

1990

High Speed Tri-temp. Handler developed.

1991

SOP Handler and QFP Handler developed.

1992

Integrated System for photo-coupler developed.

1995

Discrete Device Parallel Tester and Integrated System for power devices developed.

1997

Small Signal Device Tester, High Speed SOT23 Handler, and High Speed QFP Handler developed.

1999

Obtained ISO9001. (UKAS, RVA)

CSP Handler, MAP System, and IC Tester developed.

2000

Listed its shares on the over-the-counter market of the Japan Securities Dealers Association (JASDAQ) with a paid-up-capital of JPY 2.5 billion.

SOT23 New Integrated System, and Dynamic Test System developed.

2001

Expansion of headquarters factory completed..

2002

Formed business units for each product category by integrating R&D, engineering and sales & marketing groups.

Announced managerial creed and code of conduct.

High Speed TSSOP Handler and High Speed Power Device Handler with Taping Unit developed.

2003

High Speed CSP MAP Picker developed.

High Speed SOT Handler with Taping Unit developed.

TESEC CHINA (Shanghai) CO., LTD. opened in Shanghai, CHINA.

2004

TESEC Kumamoto Office opened in Mashiki, Kamimashiki, Kumamoto.

1000th Discrete Device Test System 881-TT shipped.

2005

Small signal high speed handler developed

2006

ISO 14001(UKAS) acquisition.

Merged the Tesec Service Corporation.

2007

High speed picker handler system developed.

2008

Tesec obtained the Handler business ownership transferring from Yokogawa Electric Corporation.

transferring from Yokogawa Electric Corporation.

2010

Stock exchange listing is changed from JASDAQ to OSAKA stock exchange bourse due to merger.

OSAKA security exchange Hercules market & JASDAQ stock exchange market.

Stock list on OSAKA JASDAQ (Standard) due to NEO market unification.

Tri-temperature power device handler developed.

2012

Tesec Inc office (Connecticut/USA) moved to California/USA

2013

Stock is listed on the Tokyo stock exchange bourse JASDAQ (Standard)
due to the merger of the Tokyo stock exchange bourse and Osaka stock exchange bourse.

2014

MEMS handler developed.

2015

Received TPEC Constellation Award.

2016

Jointly developed "Fortia" power device measurement system with ACCRETECH

2019

Celebrates 50th anniversary

2020

Developed Tri-Temp MAP handler

2021

・Development of Tri-Temp TAB handler

・Acquired CASBEE real estate evaluation certification (S rank) for the head office building

2022

listed on the Tokyo Stock Exchange Standard Market
due to the revision of the market classification of the Tokyo Stock Exchange