471-TT Version LA

The 471-TT Version LA is a fully automated wafer-level (CP process) test system for power semiconductors, including SiC MOSFETs, GaN FETs, Si MOSFETs, and IGBTs. In addition to DC static characteristic measurements such as breakdown voltage (Vds/Vdss), leakage current (IDSS), threshold voltage (Vgs(th)), and on-resistance (Rds(on)), the system enables continuous one-pass (single-contact) testing of avalanche ruggedness and avalanche energy under inductive load switching conditions using UIS/UIL (Unclamped Inductive Switching) methodology. Equipped with high-power test capability of up to 2 kV and 200 A, the system supports volume production inspection and KGD (Known Good Die) screening for both 200 mm (8-inch) and 300 mm (12-inch) wafers. Through full integration with Tokyo Seimitsu wafer probers (UF2000 and AP3000 with DARUMA Chuck), the 471-TT Version LA delivers high-quality and high-efficiency testing solutions for automotive and industrial power devices.

471-TT

471-TT is a DC test system for power devices that enables simultaneous testing of multiple dies in the wafer testing process. Supporting simultaneous testing for 8-parallel and 16-parallel configurations, it achieves a significant throughput improvement compared to conventional single-testing methods. It contributes to enhancing productivity and reducing test costs in the mass production inspection process of power semiconductors, providing a highly efficient wafer testing environment. In addition, inherited from TESEC's accumulated high-voltage and high-current measurement technology, it supports high-voltage application of up to 2kV. It not only enables high-precision evaluation of DC characteristics for various power semiconductor devices such as SiC MOSFETs, GaN HEMTs, IGBTs, and diodes, but also supports avalanche measurement, which is in high market demand. Through this, it assists in quality evaluation, reliability evaluation, and inspection efficiency improvement in mass production processes for SiC devices and next-generation power semiconductors. Furthermore, it supports capacitance measurements such as Rg and Ciss, which are frequently requested. High-speed data transfer via LAN communication and high-speed relay switching functions shorten test times, contributing to tact time improvements across the entire production line. It is the optimal test solution for the high-volume production power semiconductor market, including power semiconductors for EVs, inverters for industrial equipment, and devices for renewable energy applications.

431-TT

The 431-TT is a high-performance DC test system supporting static characterization of a wide range of power semiconductor devices, including SiC (silicon carbide), GaN (gallium nitride), IGBTs, MOSFETs, power transistors, and diodes. Covering a broad array of applications from R&D and evaluation to mass production processes, it delivers high-precision, highly efficient characterization of power devices requiring high-voltage and high-current measurement. The standard configuration supports up to 1.2 kV / 65 A (130 A between C-E), while the expanded configuration supports up to 2.2 kV / 200 A. Adding optional units makes it possible to build a measurement environment capable of up to 10 kV / 1200 A. Meeting the demands for higher breakdown voltages and larger currents in next-generation power semiconductors, it provides an optimal test solution for developing and quality-evaluating devices aimed at EVs (electric vehicles), renewable energy systems, industrial equipment inverters, and power supply units. In addition, seamless integration with probers and handlers allows for an end-to-end evaluation environment from wafer testing to final testing, achieving both increased productivity and high-quality device evaluation.

530-IT

530-IT is a test system optimized for the evaluation and inspection of IPDs (Intelligent Power Devices) and IPMs (Intelligent Power Modules), fusing TESEC's accumulated power device measurement technology with IC tester technology. Capable of handling complex power semiconductor products that integrate logic ICs and power devices, it can be utilized for a wide range of applications from characteristic evaluation in the development stage to quality inspection in the mass production process. In recent years, IPMs and power modules used in electric vehicles (EVs), industrial machinery, air conditioners, servo motors, and renewable energy systems increasingly feature integrated advanced protection and control circuits. The 530-IT is equipped with a diverse range of power supplies and measurement capabilities required for evaluating the characteristics of these high-functionality power semiconductors, efficiently assessing device performance and reliability. Additionally, it supports high-voltage and high-current measurements up to 2.2kV / 67A, with expandable configurations allowing evaluation up to 200A. Furthermore, with capabilities for integration with external measuring instruments and parallel testing functionality, it provides a highly scalable test platform that flexibly adapts to the diversifying power semiconductor market.

3430-SW

3430-SW is a dynamic test system for power semiconductors designed to quickly and accurately evaluate the dynamic characteristics of IGBTs and MOSFETs. It enables evaluation under conditions close to actual device operation, including switching time measurement, short-circuit withstand capability testing (I-Short), and reverse recovery characteristics (trr) evaluation. High efficiency and high reliability are required for modern power semiconductors such as SiC MOSFETs and high-voltage IGBTs. The 3430-SW supports test conditions up to the 1500V and 1000A class, assisting in the development and quality evaluation of devices for EV inverters, industrial machinery, and renewable energy power conversion systems.

4324-KT

4324-KT is a system designed for thermal resistance measurement and SOA (Safe Operating Area) evaluation of power semiconductor devices such as transistors, diodes, MOSFETs, and IGBTs. Transient thermal resistance measurement allows for the evaluation of device heat generation characteristics, while safe operating area testing verifies reliability and durability. In high-reliability applications such as automotive power semiconductors for EVs, industrial inverters, and power conversion equipment for renewable energy, thermal design and reliability evaluation are critical. Since the 4324-KT can perform both thermal characterization and SOA testing in a single unit, it contributes to improved development efficiency and enhanced quality assurance.

4408-KT

The 4008-KT is a thermal characterization system designed for high-precision measurement of transient thermal resistance in next-generation power semiconductor devices, including GaN HEMTs. By utilizing the change in VGS (ΔVGS) corresponding to temperature variation, it evaluates thermal resistance characteristics and quantitatively analyzes the heat generation and dissipation performance of devices. It provides an optimal solution for thermal evaluation in R&D, quality assurance, and volume production lines for GaN power devices. In the high-density packaging semiconductor market—such as EV power supply systems, high-efficiency power converters, and GaN power devices for industrial equipment—the importance of thermal design is growing continuously. The 4008-KT quickly and accurately measures thermal resistance (Rth) and temperature rise (ΔT), supporting improvements in device performance and reliability.

4602-LV

The 4602-LV is an UIS tester (L-load tester) designed for avalanche capability testing and reliability evaluation of power semiconductor devices, including MOSFETs. By monitoring operation waveforms during inductive load turn-off and performing evaluations based on the SOA (Safe Operating Area), it accurately judges device durability and quality. Furthermore, it supports VDS(SUS) measurement under specified current conditions, making it suitable for a wide range of applications from product development to mass production quality assurance. In recent years, MOSFETs and power devices used in electric vehicles (EVs), industrial inverters, power supply equipment, and other applications have seen progress toward lower on-resistance and higher currents. Consequently, cases where sufficient evaluation is difficult using conventional methods are increasing. The 4602-LV adopts new measurement methods such as VD-OFF mode and Time-Trip mode to achieve avalanche testing in high-current environments. Furthermore, it supports test conditions up to 300V and 200A, meeting the evaluation needs of automotive MOSFETs and high-reliability power semiconductors.