UIS Tester for Avalanche Capability Evaluation | MOSFET & Power Semiconductor Reliability Testing

4602-LV

4602-LV

The 4602-LV is an UIS tester (L-load tester) designed for avalanche capability testing and reliability evaluation of power semiconductor devices, including MOSFETs. By monitoring operation waveforms during inductive load turn-off and performing evaluations based on the SOA (Safe Operating Area), it accurately judges device durability and quality. Furthermore, it supports VDS(SUS) measurement under specified current conditions, making it suitable for a wide range of applications from product development to mass production quality assurance.
In recent years, MOSFETs and power devices used in electric vehicles (EVs), industrial inverters, power supply equipment, and other applications have seen progress toward lower on-resistance and higher currents. Consequently, cases where sufficient evaluation is difficult using conventional methods are increasing. The 4602-LV adopts new measurement methods such as VD-OFF mode and Time-Trip mode to achieve avalanche testing in high-current environments. Furthermore, it supports test conditions up to 300V and 200A, meeting the evaluation needs of automotive MOSFETs and high-reliability power semiconductors.

Features

・Ideal for Avalanche Capability Evaluation of MOSFETs and Power Semiconductors
Evaluates the avalanche capability of MOSFETs and various power devices with high precision through waveform monitoring during inductive load turn-off and SOA determination. Provides an optimal measurement environment for device reliability testing and quality assurance processes.
・Supports High-Current Measurement Up to 300V / 200A
Supports VD-ON mode and VD-OFF mode, enabling measurement up to 300V and 200A. Achieves a wide range of evaluations from medium-voltage to automotive power devices.
・High-Current Avalanche Testing via New Measurement Methods
Equipped with VD-OFF mode and Time-Trip mode, enabling high-current testing of low-on-resistance MOSFETs, which was difficult to achieve with conventional methods. Addresses the evaluation needs of next-generation power semiconductors.
・Equipped with Diverse Evaluation Functions
Standard features include rich evaluation capabilities such as peak drain current (IDP) measurement during avalanche testing, gate ON-time measurement, and up to 250 repeat tests.
・Improved Work Efficiency Through Test Automation
Optional programmable coils and PC control software streamline test program creation, data acquisition, and test result management, contributing to increased productivity in R&D and evaluation workflows.
・Supports Evaluation of Power Devices for EV and Industrial Equipment
Can be utilized as an evaluation and testing environment for applications requiring high reliability, such as power modules for EVs, industrial inverters, motor drives, and MOSFETs for power supply equipment.

 Item   Specifications

Drain Current (Id)

0.5 ~ 200.0 A

Peak Drain Current (Idp)

0.5 ~ 250.0 A

Drain Voltage (Vd)

VD-ON MODE : 10.0 ~ 300.0 V
VD-OFF MODE: 10.0 ~ 200.0 V

Gate Voltage (Vg)

Reverse Gate Voltage (Vgr)

00.0 ~ 30.0 V
00.0 ~ 30.0 V

Voltage Limit (V-GATE)

0201 ~ 2000 V
010.0 ~ 200.0 V

IH Limit

000.5 ~ 200.0 A

IL Limit

000.1 ~ 200.0 A

Gate ON Time (TG)

000µs ~ 9.99 ms

Post Short Detection Time (DT)

000µs ~ 9.99 ms
※VD-ON MODE: 10.0 ~ 300.0 V (Conventional 3702-LV’s Measurement Method)
※VD-OFF MODE: 10.0 ~ 200.0 V (New Measurement Method)