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Product

Test Systems

3430-SW

3430-SW

3430-SW is designed to measure the dynamic characteristics of IGBT/MOSFET devices at high speed. Parallel measurement is available at up to 4 test stations by connecting the 3430-SW and respective test stations provided for test items. (Standard: 2 test stations)
Whole system can be controlled by on computer.

Feature

・Low inductance structure reproduces ideal waveforms
・High speed waveform analysis shortened the test time drastically from the conventional model

Contact
 Item Switching Time Measurement I-Short Measurement trr Measurement

VCE

 30 ～ 1,500V(1V Step) 30 ～ 1,500V(1V Step) 30 ～ 1,500V(1V Step)

IC

 1 ～ 300A(1A Step) 1 ～ 1,000A(1A Step) 1 ～ 300A(1A Step)

IC Trip

 1 ～ 300A(1A Step) － 1 ～ 300A(1A Step)

IC max

 1 ～ 1,000A(1A Step) 1 ～ 1,000A(1A Step) 1 ～ 1,000A(1A Step)

VGE

 ±30.0V(0.1V Step) ±30.0V(0.1V Step) ±30.0V(0.1V Step)

RG

 1 ～ 250Ω(1Ω Step) 1 ～ 250Ω(1Ω Step) 1 ～ 250Ω(1Ω Step)

Pulse

 Single/Double Single Double

T1

 000.1µs ～ 50.0ms
(0.1µs Step)		 000.1 ～ 50.0µs
(0.1µs Step)		 000.1µ ～ 50.0ms
(0.1µs Step)

T2

 000.1 ～ 999.9µs
(0.1µs Step)		 － 000.1 ～ 999.9µs
(0.1µs Step)

T3

 000.1 ～ 999.9µs
(0.1µs Step)		 － 000.1 ～ 999.9µs
(0.1µs Step)

R Load

 Plug in － －

L Load

 Plug in － Plug in

Pre check

 GS Short/Open/Short/Leak GS Short/Open/
Short/Leak		 Vdsf (DUT)/ GS Short/
Open/Short/Leak
(Dummy)

Post check

 Leak Leak Leak (Dummy)

Test Item

 td (on)/td (off)/ton/toff/tr/tf/Eon/Eoff/IC0 SC trr/ trr1/ trr2/ Irr/ Qrr/
Qrr1/ Qrr2/IF/ dIF/dt/
dI (rec)M/dt

Test Time

 230ms 140ms 250ms

DSO

 HDO4104A
(TELEDYNE LECROY)		 － HDO4104A
(TELEDYNE LECROY)

 

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