4324-KT

4324-KT is a system designed for thermal resistance measurement and SOA (Safe Operating Area) evaluation of power semiconductor devices such as transistors, diodes, MOSFETs, and IGBTs. Transient thermal resistance measurement allows for the evaluation of device heat generation characteristics, while safe operating area testing verifies reliability and durability.
In high-reliability applications such as automotive power semiconductors for EVs, industrial inverters, and power conversion equipment for renewable energy, thermal design and reliability evaluation are critical. Since the 4324-KT can perform both thermal characterization and SOA testing in a single unit, it contributes to improved development efficiency and enhanced quality assurance.

Feature

• Thermal Resistance Measurement for MOSFETs, IGBTs, and Transistors
Evaluates transient thermal resistance (Rth) of various power semiconductors with high accuracy.
• Reliability Testing via SOA Evaluation
Verifies device durability and quality through safe operating area testing.
• Automatic Display of Temperature Rise and Thermal Resistance
Calculates and displays ΔT and Rth to reduce evaluation man-hours.
• Equipped with Device Protection Features
Contact check and abnormality detection functions reduce the risk of device damage during measurement.
• Ideal for Power Semiconductor Development and Mass Production Quality Evaluation
Supports a wide range of applications from R&D to mass production processes.


■ Software Option Examples
• PC Tester Control Software
(Test program creation, data collection, counter collection)
• Device-Specific Characteristic Curve Display Software
• Measurement Data Collection Software using Function Check Units