Test Systems



The KT series testers are designed to measure the thermal resistance characteristics of transistors, diodes, MOSFETs, and IGBTs.
It can also measure the Safe Operating Area (SOA) of the devices.
In addition to Contact Check function for more accurate measurement, device protection circuit is also equipped.


・Measurement results are displayed on the front panel display
・Raised temperature ΔT can be displayed as a calculation result
・Thermal resistance Rth can be displayed as a calculation result
・Multi-test function
・60 test programs can be stored
・Contact Check/Open, Short Check
・Oscillation Detection
・Operation can be controlled from TESEC DC Tester
・Equipped with a function to detect abnormalities on measurement
・GP-IB/RS-232C interface enables external equipment to control this tester
・Function check unit (4321-AB) can be connected (option)

■ Optional Software Examples
・Software to control the tester from PC
(Test program creation, data collection, and counter collection)
・Software to display the characteristic curve per device
・Software to collect measurement data using the function check unit

 Item   Specifications

Voltage Range


1–200 V

 Emitter Current (IE/IDS)

 00.001–50.000 A

Measurement Current (IM)

1–100 mA
1–400 mA  (ΔVCE)

Power Applying Time (PT)

 300 µs–9.99 s

Delay Time (DT)

10–999 µs

Lower Limit

000.0–999.9 mV , 0000–9999 mV

Upper Limit

000.0–999.9 mV , 0000–9999 mV

Measurement Range

VBE1/VDS1/VGS1/VF1/VCE : 0000–9999 mV
ΔVBE/ΔVDS/ΔVGS/ΔVF/ΔVCE : 000.0–999.9 mV (Resolution 0.1 mV)
0000–9999 mV (Resolution 1 mV)