4408-KT

The 4008-KT is a thermal characterization system designed for high-precision measurement of transient thermal resistance in next-generation power semiconductor devices, including GaN HEMTs. By utilizing the change in VGS (ΔVGS) corresponding to temperature variation, it evaluates thermal resistance characteristics and quantitatively analyzes the heat generation and dissipation performance of devices. It provides an optimal solution for thermal evaluation in R&D, quality assurance, and volume production lines for GaN power devices.
In the high-density packaging semiconductor market—such as EV power supply systems, high-efficiency power converters, and GaN power devices for industrial equipment—the importance of thermal design is growing continuously. The 4008-KT quickly and accurately measures thermal resistance (Rth) and temperature rise (ΔT), supporting improvements in device performance and reliability.

Feature

・Support for Transient Thermal Resistance Evaluation of GaN HEMTs
Evaluates the thermal characteristics of GaN devices with high precision using high-sensitivity measurement via ΔVGS.
・Automatic Calculation of Thermal Resistance (Rth) and Temperature Rise (ΔT)
Calculates thermal resistance values and temperature rise from measurement results, streamlining evaluation tasks.
・Support for Thermal Design and Reliability Evaluation of Power Devices
Covers a wide range of requirements, from thermal analysis at the development stage to quality control during mass production.
・Integration with TESEC DC Testers
Combines with existing DC test systems to build an efficient evaluation environment.
・Support for External Control and Data Acquisition
GPIB and RS-232C interfaces enable seamless integration into automated evaluation systems.

■ Software Option Examples
・PC-based Tester Control Software
(Test program creation, data acquisition, counter acquisition)
・Measurement Data Acquisition Software using Functional Check Unit