471-TT Version LA

The 471-TT Version LA is a wafer-level test system designed for Si MOSFETs, SiC MOSFETs, and IGBTs. In addition to DC characterization Testing, it performs Avalanche Energy Testing using UIS (Unclamped Inductive Switching) in a One-pass (Single-pass) test sequence. With test capabilities of up to 2kV and 200 A, the system supports high-volume production testing of both 200 mm and 300 mm wafers. Integrated solution with ACCRETECH probers (UF2000 and AP3000), it provides highly efficien, high-quality wafer testing for high-voltage, high-current power semiconductor devices.

Feature

・Space-Saving Design & High-Quality Wafer Testing
 Combines a compact footprint with exceptional wafer testing performance.
・Seamless Test Flow
Enables continuous and efficient testing from DC characterization (high current and high voltage) through UIS (Unclamped Inductive Switching) testing, all within a One-pass (Single-pass) workflow.
・Optimized High-Quality Test Environment
The WTS (Wafer Test System), DARUMA stage, and pressure-card functionality work together to provide a stable, high-quality test environment.
・Simultaneous 4-Die Testing 
Supports simultaneous testing of up to four dies, significantly improving production throughput.
・High-Speed Protection During UIS Testing (Inductive Load)
In the event of an unexpected device failure during UIS testing, the measurement circuit is interrupted within 500 ns or less, minimizing damage to the wafer, probe card, and equipment.