530-IT

530-IT is a test system optimized for the evaluation and inspection of IPDs (Intelligent Power Devices) and IPMs (Intelligent Power Modules), fusing TESEC's accumulated power device measurement technology with IC tester technology. Capable of handling complex power semiconductor products that integrate logic ICs and power devices, it can be utilized for a wide range of applications from characteristic evaluation in the development stage to quality inspection in the mass production process.
In recent years, IPMs and power modules used in electric vehicles (EVs), industrial machinery, air conditioners, servo motors, and renewable energy systems increasingly feature integrated advanced protection and control circuits. The 530-IT is equipped with a diverse range of power supplies and measurement capabilities required for evaluating the characteristics of these high-functionality power semiconductors, efficiently assessing device performance and reliability.
Additionally, it supports high-voltage and high-current measurements up to 2.2kV / 67A, with expandable configurations allowing evaluation up to 200A. Furthermore, with capabilities for integration with external measuring instruments and parallel testing functionality, it provides a highly scalable test platform that flexibly adapts to the diversifying power semiconductor market.

Feature

・Test System Optimized for IPD and IPM
Supports the evaluation of IPD and IPM products that integrate logic circuits and power devices, enabling efficient verification under complex operating conditions. Ideal for quality evaluation of power modules and smart power devices.
・High-Voltage and High-Current Power Device Measurement
Supports standard measurements up to 2.2kV / 67A, and up to 200A in expandable configurations. Equipped with the testing capabilities required to evaluate high-voltage IGBTs, MOSFETs, power modules, and more.
・Increased Productivity Through Parallel Testing
Supports simultaneous testing of 2 devices, achieving reduced test times and improved throughput. Contributes to operational efficiency and cost reduction in mass production inspection processes.
・High-Speed Leakage Current Measurement
Reduces measurement time for leakage characteristics essential in quality evaluation through its high-speed leakage measurement function. Delivers stable inspection performance even in mass production environments.
・Flexible Bias Application and Timing Control
Supports various applied waveforms and timing settings, allowing the creation of a flexible test environment tailored to device specifications and evaluation goals.
・Recipe Creation Environment Requiring No Programming Knowledge
Equipped with a language-free recipe (test program) creation feature that enables efficient test condition configuration. Contributes to shorter development cycles and reduced operational load.
・Ideal for Power Module Evaluation for EVs and Industrial Equipment
Optimized for evaluating and mass-production testing of high-reliability power semiconductor products such as EV inverters, motor control equipment, industrial machinery, and home appliance IPMs.